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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 한국진공학회(ASCT) Applied Science and Convergence Technology Applied Science and Convergence Technology Vol.31 No.3
- 발행연도
- 2022.5
- 수록면
- 71 - 74 (4page)
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초록· 키워드
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A fourth-generation light source (Korea-4GLS) with 4-GeV electron energy, 58-pm-rad electron emittance, and 400-mA electron current is under construction at Ochang, Korea. Here, we describe the advantages of the Korea-4GLS compared with the light source at Pohang (Pohang Light Source: PLS-II) in terms of the geometry of its probing techniques and application materials. In the case of probing laterally homogeneous specimens where an X-ray size from 10 𝜇m to 1 mm is permissible and the sample is generally larger, then techniques such as X-ray scattering, X-ray absorption spectroscopy, and X-ray photoelectron spectroscopy benefit from flux increase. In this case, the Korea-4GLS is better than the PLS-II in the energy range of approximately 1–2.5 keV (higher energy spectrum for soft X-ray-based techniques), 2–4 keV (medium energy-based techniques), and 10–100 keV (higher energy spectrum for hard X-ray-based techniques). When probing laterally inhomogeneous specimens, the X-ray size must be below 1 𝜇m. Here, nano-probe and spectro-nanoscopy techniques, such as coherent diffraction imaging, ptychography, scanning type transmission X-ray microscopy, or photoelectron microscopy leverage the increase in brilliance. These techniques can leverage all photon energy ranges, especially soft X-ray spectro-nanoscopes (>100-fold gain at the focused area) that require an exit slit as a virtual light source.
목차
ABSTRACT
1. Introduction
2. Impact of flux and brilliance on probing techniques
3. Conclusions
References
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