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This article provides a comprehensive guide at scanning tunneling microscopy(STM) and its spectroscopic counterpart (STS), powerful techniques that have revolutionized our ability to image and analyze surfaces at the atomic level. Based on the principle of quantum tunneling, STM and STS are among the few methods capable of simultaneously measuring the atomic and electronic structures of low-dimensional materials. However, interpreting the tunneling current data can be intricate due to various influencing factors. Moreover, the techniques have limitations, such as the inability to directly measure electron’s momentum, thus offering only partial information in some cases. Despite these challenges, the synergistic use of STM and STS with other surface analysis methods can maximize their applicability. While this article focuses primarily on the basic principles and elementary properties measurable by STM, it should be noted that the capabilities of STM and STS extend far beyond what is covered here.
목차
머리말
주사터널현미경(STM)의 동작 원리
주사터널분광법(STS)의 동작 원리
1차원 물질 연구
2차원 물질 연구
맺음말
References
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